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Research Article Issue
Mn-based MXene with high lithium-ion storage capacity
Nano Research 2024, 17 (5): 4181-4191
Published: 29 December 2023
Downloads:84

3d-transition metal (Fe, Co, Ni, and Mn)-based MXene materials have been predicted to demonstrate exceptional electrochemical performance because of their good electrical conductivity and the presence of metallic atoms with multiple charge states. However, until now, there have been no reports on MXenes based on Fe, Co, Ni, and Mn, due to the lack of 3d-metal-layered precursors. Herein, we successfully synthesized the first 3d-transition metal-based MXenes, Mn2CTx by exfoliating a layered precursor derived from the anti-perovskite bulk Mn3GaC. The as-prepared Mn2CTx MXene nanosheets were employed as anode materials in lithium-ion batteries, which exhibited stable storage capacity of 764.7 mAh·g−1 at 0.5 C, placing its storage capacities at an upper-middle level compared with other reported MXene materials as well as other Mn-based anode materials. Overall, this study opens a new avenue for MXene research by synthesizing 3d-transition metal-based MXenes for electrochemical applications.

Research Article Issue
Reliable and broad-range layer identification of Au-assisted exfoliated large area MoS2 and WS2 using reflection spectroscopic fingerprints
Nano Research 2022, 15 (9): 8470-8478
Published: 03 June 2022
Downloads:67

The emerging Au-assisted exfoliation technique enables the production of a wealth of large-area and high-quality ultrathin two dimensional (2D) crystals. Fast, damage-free, and reliable determination of the layer number of such 2D films can greatly promote layer-dependent physical studies and device applications. Here, an optical method has been developed for simple, high throughput, and accurate determination of the layer number for Au-assisted exfoliated MoS2 and WS2 films in a broad thickness range. The method is based on quantitative analysis of layer-dependent white light reflection spectra (WLRS), revealing that the intensity of exciton-induced reflection peaks can be used as a clear indicator for identifying the layer number. The simple yet robust method will facilitate fundamental studies on layer-dependent optical, electrical, and thermal properties and device applications of 2D materials. The technique can also be readily combined with photoluminescence (PL) and Raman spectroscopies to study other layer-dependent physical properties of 2D materials.

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