The objective of this study was to identify synthetic tetraploid wheats (STW) with tolerance to low nitrogen (LN) stress. We compared two STWs (S^shS^shA^mA^m and S^lS^lAA), their diploid parents, and natural tetraploid wheat (NTW) under normal and LN conditions. One excelled in early-stage LN resilience via root growth plasticity and efficient N uptake, while the other showed superior late-stage tolerance via photosynthetic retention and increased N storage. S-subgenome-encoded NPF/NRT2 transporter genes under LN stress may act as drivers of LN adaptation. In contrast, NTW showed a yield-stress tradeoff under LN. There is a possibility of boosting LN resilience in wheat breeding by targeting the S-subgenome of STWs.