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Ti3C2Tx MXene-mediated sensitization-metallization enables sandwich-structured copper@aramid films for high-performance electromagnetic interference shielding
Nano Research 2026, 19(3): 94908304
Published: 08 February 2026
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Optimizing the structural design of electromagnetic interference (EMI) shielding materials to enhance their effectiveness, mechanical properties, and thermal management remains a significant challenge. In this work, a sandwich-structured copper@aramid nanofiber/Ti3C2Tx MXene (Cu@ANF/MXene) composite film with high mechanical strength and thermal conductivity was achieved via a straightforward electroless deposition process. Crucially, Ti3C2Tx MXene serves dual roles: reinforcing the ANF matrix and sensitizing the formation of Ag seeds to facilitate subsequent Cu deposition, rather than merely acting as a conductive filler. The sandwich-structured film achieves an exceptional maximum EMI shielding effectiveness of 102.7 dB, while simultaneously integrating robust mechanical properties (149.7 MPa) and superior thermal conductivity (40.7 W·m−1·K−1). Remarkably, the sandwich-structured film exhibits a 34.5 dB enhancement in EMI shielding effectiveness compared to its non-sandwich counterpart under identical conditions, unequivocally demonstrating the critical importance of architectural optimization. This multifunctional performance underscores the significant potential of the metal@aramid composites for advanced EMI shielding applications.

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