For Cerenkov-type devices, the thermal desorption caused by the temperature rise of the high-frequency structure can cause radio frequency breakdown, which in turn leads to a decrease in output power and a shortened pulse. Based on this, the heating temperature rise effect of electromagnetic pulses on the high-frequency structure was studied, the temperature rise formula of the high-frequency structure was deduced, the scope of application of the theoretical formula was pointed out, and a numerical method to solve the temperature rise of the specimen was given. Taking the two-period 1 MV·cm^-1 high-frequency structure as an example, the numerical calculation and simulation study of temperature rise were carried out. Results show that the temperature rise effect of a single pulse with a pulse width of 100 ns on the stainless steel specimen is significantly higher than that of other materials. When the system is working at a high repetition frequency, the temperature rise of electromagnetic pulses may cause the metal material to reach the threshold of gas desorption and cause the gas to desorb to form a local high pressure. The research in the thesis can provide reference for the research of gas desorption and radio frequency breakdown in high power microwave sources.