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Nano Research
ISSN 1998-0124
e-ISSN 1998-0000
CN 11-5974/O4
Editors-in-Chief: Yadong Li, Shoushan Fan
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multi-tip scanning tunneling microscopy (MT-STM)
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Research Article
Investigation of charge carrier depletion in freestanding nanowires by a multi-probe scanning tunneling microscope
Andreas Nägelein, Matthias Steidl, Stefan Korte,
[...],
Bert Voigtländer, Werner Prost, Peter Kleinschmidt,
Thomas Hannappel
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https://doi.org/10.1007/s12274-018-2105-x
Published: 11 June 2018
2018, 11 (11): 5924-5934
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