Experimental Study on High Overload Loading of Electronic Control Module inside Electronic Detonator under Delayed State

In order to explore the failure mechanism of the electronic control module inside the electronic detonator under impact load during the postponement state, a split Hopkinson pressure bar (SHPB) experiment was conducted on the electronic detonator specimens under high overload loading. The failure conditions of the overall electronic control module and the remaining electronic control modules separated from the tantalum capacitors were obtained under different levels of loading experiments. The results indicate that the tantalum capacitor exhibited a voltage drop phenomenon at an overload of 1.495×10⁵g, with a more pronounced short-circuit failure as the overload increased. Within a certain overload range, the tantalum capacitor᾽s unique self-healing properties allow it to return to its initial level rapidly. However, when the overload exceeded the critical threshold of 3.848×10⁵g, the tantalum capacitor was irreversibly damaged. The overload resistance of other components within the module is stronger than that of the capacitor. The chip detected an anomaly after an overload of 4.155×10⁵g, while the failure of the resistor components occurs at an overload of over 4.249×10⁵g.