AI Chat Paper
Note: Please note that the following content is generated by AMiner AI. SciOpen does not take any responsibility related to this content.
{{lang === 'zh_CN' ? '文章概述' : 'Summary'}}
{{lang === 'en_US' ? '中' : 'Eng'}}
Chat more with AI
Article Link
Collect
Submit Manuscript
Show Outline
Outline
Show full outline
Hide outline
Outline
Show full outline
Hide outline
Regular Paper

SegNet-OPC: A Mask Optimization Framework in VLSI Design Flow Based on Semantic Segmentation Network

School of Computer Science and Engineering, Anhui University of Science and Technology, Huainan 232001, China
School of Artificial Intelligence, Anhui University of Science and Technology, Huainan 232001, China
School of Microelectronics, Hefei University of Technology, Hefei 230009, China
Show Author Information

Abstract

With the continuous decrease in the critical dimensions of integrated circuits, mask optimization has become the main challenge in VLSI design. In recent years, thriving machine learning has been gradually introduced in the field of optical proximity correction (OPC). Currently, advanced learning-based frameworks have been limited by low mask printability or large computational overhead. To address these limitations, this paper proposes a learning-based framework named SegNet-OPC, which can generate optimized masks from the target layout at shorter training and turnaround time with higher mask printability. The proposed framework consists of a backbone network and loss terms suitable for mask optimization tasks, followed by a fine-tuning network. The framework yields remarkable improvements over conventional methods, delivering significantly faster turnaround time and superior mask printability and manufacturability. With just 1.25 hours of training, the framework achieves comparable mask complexity while surpassing the state-of-the-art methods, achieving a minimum 3% enhancement in mask printability and an impressive 16.7% improvement in mask manufacturability.

Electronic Supplementary Material

Download File(s)
JCST-2212-13002-Highlights.pdf (262.2 KB)

References

[1]

Huang G, Hu J, He Y, Liu J, Ma M, Shen Z, Wu J, Xu Y, Zhang H, Zhong K, Ning X, Ma Y, Yang H, Yu B, Yang H, Wang Y. Machine learning for electronic design automation: A survey. ACM Trans. Design Automation of Electronic Systems, 2021, 26(5): Article No. 40. DOI: 10.1145/3451179.

[2]

Alawieh M B, Lin Y, Zhang Z, Li M, Huang Q, Pan D Z. GAN-SRAF: Subresolution assist feature generation using generative adversarial networks. IEEE Trans. Computer-Aided Design of Integrated Circuits and Systems, 2021, 40(2): 373–385. DOI: 10.1109/TCAD.2020.2995338.

[3]

Yang H, Zhong W, Ma Y, Geng H, Chen R, Chen W, Yu B. VLSI mask optimization: From shallow to deep learning. Integration, 2021, 77: 96–103. DOI: 10.1016/j.vlsi.2020.11.001.

[4]

Geng H, Zhong W, Yang H, Ma Y, Mitra J, Yu B. SRAF Insertion via supervised dictionary learning. IEEE Trans. Computer-Aided Design of Integrated Circuits and Systems, 2020, 39(10): 2849–2859. DOI: 10.1109/TCAD.2019.2943568.

[5]

Kwon Y, Shin Y. Optical proximity correction using bidirectional recurrent neural network with attention mechanism. IEEE Trans. Semiconductor Manufacturing, 2021, 34(2): 168–176. DOI: 10.1109/TSM.2021.3072668.

[6]
Kuang J, Chow W K, Young E F Y. A robust approach for process variation aware mask optimization. In Proc. the 2015 Design, Automation & Test in Europe Conference & Exhibition (DATE), Mar. 2015, pp.1591–1594. DOI: 10.7873/DATE.2015.1045.
[7]

Su Y H, Huang Y C, Tsai L C, Chang Y W, Banerjee S. Fast lithographic mask optimization considering process variation. IEEE Trans. Computer-Aided Design of Integrated Circuits and Systems, 2016, 35(8): 1345–1357. DOI: 10.1109/TCAD.2015.2514082.

[8]
Park J S, Park C H, Rhie S U, Kim Y H, Yoo M H, Kong J T, Kim H W, Yoo S I. An efficient rule-based OPC approach using a DRC tool for 0.18 μm ASIC. In Proc. the 1st IEEE International Symposium on Quality Electronic Design (Cat. No. PR00525), Mar. 2000, pp.81–85. DOI: 10.1109/ISQED.2000.838858.
[9]

Poonawala A, Milanfar P. Mask design for optical microlithography—An inverse imaging problem. IEEE Trans. Image Processing, 2007, 16(3): 774–788. DOI: 10.1109/TIP.2006.891332.

[10]
Gao J R, Xu X, Yu B, Pan D Z. MOSAIC: Mask optimizing solution with process window aware inverse correction. In Proc. the 51st Annual Design Automation Conference, Jun. 2014, pp.1–6. DOI: 10.1145/2593069.2593163.
[11]

Ma Y, Zhong W, Hu S, Gao J R, Kuang J, Miao J, Yu B. A unified framework for simultaneous layout decomposition and mask optimization. IEEE Trans. Computer-Aided Design of Integrated Circuits and Systems, 2020, 39(12): 5069–5082. DOI: 10.1109/TCAD.2020.2981457.

[12]

Yang H, Li S, Deng Z, Ma Y, Yu B, Young E F Y. GAN-OPC: Mask optimization with lithography-guided generative adversarial nets. IEEE Trans. Computer-Aided Design of Integrated Circuits and Systems, 2020, 39(10): 2822–2834. DOI: 10.1109/TCAD.2019.2939329.

[13]
Jiang B, Liu L, Ma Y, Zhang H, Yu B, Young E F Y. Neural-ILT: Migrating ILT to neural networks for mask printability and complexity co-optimization. In Proc. the 39th International Conference on Computer-Aided Design, Nov. 2020, Article No. 20. DOI: 10.1145/3400302.3415704.
[14]

Hopkins H H. The concept of partial coherence in optics. Proceedings of the Royal Society A: Mathematical, Physical and Engineering Sciences, 1951, 208(1093): 263–277. DOI: 10.1098/rspa.1951.0158.

[15]
Cobb N B. Fast optical and process proximity correction algorithms for integrated circuit manufacturing [Ph.D. Thesis]. University of California, Berkeley, 1998.
[16]
Park T, Efros A A, Zhang R, Zhu J Y. Contrastive learning for unpaired image-to-image translation. In Proc. the 16th European Conference on Computer Vision, Aug. 2020, pp.319–345. DOI: 10.1007/978-3-030-58545-7_19.
[17]

Albelwi S. Survey on self-supervised learning: Auxiliary pretext tasks and contrastive learning methods in imaging. Entropy, 2022, 24(4): 551. DOI: 10.3390/e24040551.

[18]
Wang H, Guo X, Deng Z, Lu Y. Rethinking minimal sufficient representation in contrastive learning. In Proc. the 2018 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), Jun. 2022, pp.16020–16029. DOI: 10.1109/CVPR52688.2022.01557.
[19]

Badrinarayanan V, Kendall A, Cipolla R. SegNet: A deep convolutional encoder-decoder architecture for image segmentation. IEEE Trans. Pattern Analysis and Machine Intelligence, 2017, 39(12): 2481–2495. DOI: 10.1109/TPAMI.2016.2644615.

[20]
Milletari F, Navab N, Ahmadi S A. V-Net: Fully convolutional neural networks for volumetric medical image segmentation. In Proc. the 4th International Conference on 3D Vision (3DV), Oct. 2016, pp.565–571. DOI: 10.1109/3DV.2016.79.
[21]
Banerjee S, Li Z, Nassif S R. ICCAD-2013 CAD contest in mask optimization and benchmark suite. In Proc. the 2013 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), Nov. 2013, pp.271–274. DOI: 10.1109/ICCAD.2013.6691131.
[22]
Zhao H, Shi J, Qi X, Wang X, Jia J. Pyramid scene parsing network. In Proc. the 2017 IEEE Conference on Computer Vision and Pattern Recognition (CVPR), Jul. 2017, pp.6230–6239. DOI: 10.1109/CVPR.2017.660.
[23]
Tsai Y H H, Wu Y, Salakhutdinov R, Morency L P. Self-supervised learning from a multi-view perspective. In Proc. the 9th International Conference on Learning Representations, May 2021, pp.1–18.
[24]

Fu J, Liu J, Jiang J, Li Y, Bao Y, Lu H. Scene segmentation with dual relation-aware attention network. IEEE Trans. Neural Networks and Learning Systems, 2021, 32(6): 2547–2560. DOI: 10.1109/TNNLS.2020.3006524.

[25]
Simonyan K, Zisserman A. Very deep convolutional networks for large-scale image recognition. In Proc. the 3rd International Conference on Learning Representations, May 2015, pp.1–14.
[26]
He K, Zhang X, Ren S, Sun J. Deep residual learning for image recognition. In Proc. the 2016 IEEE Conference on Computer Vision and Pattern Recognition (CVPR), Jun. 2016, pp.770–778. DOI: 10.1109/CVPR.2016.90.
[27]
Lin T Y, Goyal P, Girshick R, He K, Dollár P. Focal loss for dense object detection. In Proc. the 2017 IEEE International Conference on Computer Vision, Jul. 2017, pp.2999–3007. DOI: 10.1109/ICCV.2017.324.
[28]
Zhao R, Qian B, Zhang X, Li Y, Wei R, Liu Y, Pan Y G. Rethinking dice loss for medical image segmentation. In Proc. the 2020 IEEE International Conference on Data Mining (ICDM). Nov. 2020, pp.851–860. DOI: 10.1109/ICDM50108.2020.00094.
[29]

Hossain M S, Betts J M, Paplinski A P. Dual focal loss to address class imbalance in semantic segmentation. Neurocomputing, 2021, 462: 69–87. DOI: 10.1016/j.neucom.2021.07.055.

[30]
Rezaei-Dastjerdehei M R, Mijani A, Fatemizadeh E. Addressing imbalance in multi-label classification using weighted cross entropy loss function. In Proc. the 27th National and 5th International Iranian Conference on Biomedical Engineering (ICBME), Nov. 2020, pp.333–338. DOI: 10.1109/ICBME51989.2020.9319440.
Journal of Computer Science and Technology
Pages 500-512
Cite this article:
Xu H, Qi P, Tang F-X, et al. SegNet-OPC: A Mask Optimization Framework in VLSI Design Flow Based on Semantic Segmentation Network. Journal of Computer Science and Technology, 2025, 40(2): 500-512. https://doi.org/10.1007/s11390-023-3002-7

43

Views

0

Crossref

0

Web of Science

0

Scopus

0

CSCD

Altmetrics

Received: 09 January 2023
Accepted: 16 November 2023
Published: 31 March 2025
© Institute of Computing Technology, Chinese Academy of Sciences 2025
Return