Nano Research

ISSN 1998-0124 e-ISSN 1998-0000 CN 11-5974/O4

Editors-in-Chief: Yadong Li, Shoushan Fan

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Keyword: atomic defects

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Research Article

Accurate atomic scanning transmission electron microscopy analysis enabled by deep learning

Tianshu Chu, Lei Zhou, Bowei Zhang, Fu-Zhen Xuan

https://doi.org/10.1007/s12274-023-6104-1

Published: 23 September 2023

2024, 17 (4): 2971-2980

Downloads: 63 | Views: 689 |

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