Nano Research

ISSN 1998-0124 e-ISSN 1998-0000 CN 11-5974/O4
Editors-in-Chief: Yadong Li, Shoushan Fan
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Keyword: current leakage
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Research Article
Drain-engineered carbon-nanotube-film field-effect transistors with high performance and ultra-low current leakage
https://doi.org/10.1007/s12274-019-2558-6
Published: 16 November 2019
2020, 13 (7): 1875-1881
Downloads: 34 | Views: 733 | PDF (28.5 MB)
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