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Research Article
Trap and 1/f-noise effects at the surface and core of GaN nanowire gate-all-around FET structure
Mallem Siva Pratap Reddy, Ki-Sik Im, Jung-Hee Lee, [...], Raphael Caulmione, Sorin Cristoloveanu << Fewer
https://doi.org/10.1007/s12274-019-2292-0
Published: 17 January 2019
Downloads: 28 | Views: 603 | PDF (2.9 MB)
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