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Open Access

Instance segmentation algorithm of electronic components based on improved YOLOv5

Yining YANGHonglei WEI( )
School of Mechanical Engineering and Automation, Dalian Polytechnic University, Dalian 116000, China
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Abstract

To address the challenge of automatic recognition of electronic components on an assembly line, an improved YOLOv5 was used to implement instance segmentation of four categories of electronic components. Firstly, multi-channel histogram equalization was used for image preprocessing. Then, the YOLOv5 was improved: Segmentation head was added; Sequeeze-and-excitation net(SE-Net) channel attention module was embedded to enhance the feature extraction capability and to compress the useless information without increasing the model complexity; GhostNet was used to make the model lightweight; and BiFPN was used to enhance model feature fusion capability. Finally, experimental results showed that the mAP of the proposed method could reach 96.7% and the detection time of a single image was 45.5 ms. The results prove that proposed method has superior performance than that based on mask region-based conventional neural network(Mask RCNN) and initial YOLOv5, and has practical significance for automatic detection of electronic components.

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Journal of Measurement Science and Instrumentation
Pages 23-32

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Cite this article:
YANG Y, WEI H. Instance segmentation algorithm of electronic components based on improved YOLOv5. Journal of Measurement Science and Instrumentation, 2024, 15(1): 23-32. https://doi.org/10.62756/jmsi.1674-8042.2024003

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Received: 17 October 2023
Revised: 15 November 2023
Accepted: 24 January 2024
Published: 01 March 2024
© The Author(s) 2024.

The articles published in this open access journal are distributed under the terms of the Creative Commons Attribution 4.0 International License (http://creativecommons.org/licenses/by/4.0/), which permits use, distribution and reproduction in any medium, provided the original work is properly cited.