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Open Access

High dynamic range 3D measurement based on structured light: A review

Pan ZHANGZhong KAIZhongwei LI( )Xiaobo JINBin LICongjun WANGYusheng SHI
State Key Laboratory of Material Processing and Die & Mould Technology, School of Materials Science and Engineering, Huazhong University of Science and Technology, Wuhan 430074, China

Peer review under responsibility of Editorial Committee of JAMST

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Abstract

Structured light method is one of the best methods for automated 3D measurement in industrial production due to its stability and speed. However, when the surface of industrial parts has high dynamic range (HDR) areas, e.g. rust, oil stains, or shiny surfaces, phase calculation errors may happen due to low modulation and pixel over-saturation in the image, making it difficult to obtain accurate 3D data. This paper classifies and summarizes the existing high dynamic range structured light 3D measurement technologies, compares the advantages and analyzes the future development trends. The existing methods are classified into multiple measurement fusion (MMF) and single best measurement (SBM) based on the measurement principle. Then, the advantages of the various methods in the two categories are discussed in detail, and the applicable scenarios are analyzed. Finally, the development trend of high dynamic range 3D measurement based on structed light is proposed.

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Journal of Advanced Manufacturing Science and Technology
Cite this article:
ZHANG P, KAI Z, LI Z, et al. High dynamic range 3D measurement based on structured light: A review. Journal of Advanced Manufacturing Science and Technology, 2021, 1(2): 2021004. https://doi.org/10.51393/j.jamst.2021004

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Received: 05 February 2021
Revised: 22 February 2021
Accepted: 04 March 2021
Published: 15 April 2021
© 2021 JAMST All rights reserved.

This is an Open Access article distributed under the terms of the Creative Commons Attribution License (http://creativecommons.org/licenses/by/4.0),which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

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