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Research Article | Open Access | Just Accepted

Janus-engineering on the geometrical and electronic characteristics of the lateral and twisted MoSeS/MoSe2 heterostructures investigated by scanning tunneling microscopy

Chenhao Zhang1,§, Jiangpeng Zhou1,§, Yanjun Li1, Zongnan Zhang1,2( ), Mengyu Liu1, Chunmiao Zhang1, Xuanli Zheng1, Feiya Xu1, Lijing Kong1, Xu Li1, Zhiming Wu1, Yaping Wu1( ), Junyong Kang1

1 Department of Physics, Engineering Research Centre for Micro-Nano Optoelectronic Materials and Devices at Education Ministry, Fujian Provincial Key Laboratory of Semiconductor Materials and Applications, Xiamen University, Xiamen 361005, China

2 Beijing National Laboratory for Condensed Matter Physics and Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China

§ These authors contributed equally to this work.

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Abstract

Janus transition metal dichalcogenides (TMDs) and their heterostructures offer rich opportunities for property modulation, yet the underlying structural and electronic mechanisms remain elusive. Herein, using scanning tunneling microscopy and spectroscopy (STM/STS), we systematically investigated the structure and electronic state characteristics in lateral and vertically twisted Janus MoSeS/MoSe2 heterostructures fabricated by hydrogen-plasma-assisted sulfurization. Sulfur substitution induces a 0.2 Å reduction in atomic amplitude and a 0.66 eV widening of the bandgap, which density functional theory (DFT) attributes to the electronegativity of substituted atoms and the intrinsic built-in electric field of MoSeS, respectively. In a moiré superlattice of a 7.4°-twisted Janus MoSeS/MoSe2 vertical heterostructure, we identify atomic stacking geometries and stacking‑dependent bandgap variations, corroborated by the theoretical simulations. Moreover, the interlayer polarization field arising from stacking further induces nonnegligible modification on the bandgap. This work establishes comprehensive structure-property correlations in Janus MoSeS/MoSe2 heterostructures, providing a solid foundation for the development of advanced Janus TMDs-based electronic and optoelectronic devices.

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Cite this article:
Zhang C, Zhou J, Li Y, et al. Janus-engineering on the geometrical and electronic characteristics of the lateral and twisted MoSeS/MoSe2 heterostructures investigated by scanning tunneling microscopy. Nano Research, 2026, https://doi.org/10.26599/NR.2026.94909217
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Received: 19 July 2026
Revised: 10 September 2026
Accepted: 24 September 2026
Available online: 24 September 2026

© The Author(s) 2026. Published by Tsinghua University Press.

This is an open access article under the terms of the Creative Commons Attribution 4.0 International License (CC BY 4.0, https://creativecommons.org/licenses/by/4.0/)