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In recent years, low-dimensional semiconductors have attracted widespread attention in the field of next-generation broadband infrared photodetectors due to their tunable band structures, strong light-matter interactions, and compatibility with mixed-dimensional integration. Among them, tellurium (Te) and bismuth selenide (Bi2O2Se) have become ideal candidate materials for high-performance detection due to their inherent anisotropy, high carrier mobility, and broad spectral response. Constructing heterojunction photodetectors based on these materials can achieve self-powered operation and suppress dark current. Heterojunction interface engineering and band structure design capabilities are crucial for constructing high-performance Te/Bi2O2Se heterojunction photodetectors. Therefore, we in-situ construct a one-dimensional (1D) Te/two-dimensional (2D) Bi2O2Se heterojunction by a two-step chemical vapor deposition method, which shown a clear interface and type-II band alignment structure. Therefore, the photodetector based on Te/Bi2O2Se heterojunction working in self-driven mode exhibits high performance, showing a high responsivity of ~ 0.89 A·W−1 and a fast response time of ~ 29/41 μs under 1550 nm light irradiation. Further, owing to the optical absorption anisotropy of tellurium, the device exhibited a high polarization ratio of 2.8 and successfully demonstrated polarization optical communication and polarization imaging applications. This work provides new ideas for the in-situ construction strategy of high-quality mixed-dimensional van der Waals heterojunctions and the research on high-performance photodetectors and their applications.

This is an open access article under the terms of the Creative Commons Attribution 4.0 International License (CC BY 4.0, https://creativecommons.org/licenses/by/4.0/).
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