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Research Article | Open Access

Synergistic shallow impurity levels and multiscale defect engineering in GeTe-based thermoelectrics

Zhongwei Zhang1,2Fengting Mao2Min Yao2Shiyuan Zhao2Sijing Zhu2Zhengniu Pan2Jun-Liang Chen3Zhixiang Zhang3Qi Zhou2Wentao Zhang4Jianmin Chen4Jie Gao3( )Lei Miao2 ( )
School of Chemistry and Chemical Engineering, Guangxi University, Nanning 530004, China
School of Physical Science and Technology, Guangxi University, Nanning 530004, China
Guangxi Key Laboratory of Information Materials, Guangxi Collaborative Innovation Center of Structure and Property for New Energy Materials, Guilin University of Electronic Technology, Guilin 541004, China
Henan Hongchang Electronics Co., Ltd., Xuchang 461500, China
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Abstract

By the coordinated implementation of shallow impurity level and multiscale defect engineering, this study achieves the simultaneous optimization of electrical transport and thermal conduction in GeTe-based thermoelectric (TE) materials. This synergistic mechanism originates from the unique electronic configuration of Ni, whose d–sp orbital hybridization introduces shallow impurity levels that promote valence band convergence, thereby enhancing the effective mass of carriers and the Seebeck coefficient. Concurrently, in situ reactions between Ni and Ge form NiGe nanophases (10–30 nm), constructing multiscale defect structures that enable full-spectrum phonon scattering and suppress the lattice thermal conductivity of the Ge0.885Sb0.1Ni0.015Te sample to ~0.8 W∙m−1∙K−1 at 323 K. Leveraging this cooperative optimization, Ge0.885Sb0.1Ni0.015Te attains a peak dimensionless figure of merit (ZT) value of 2.15 at 773 K and an average ZTavg of ~1.45 (323–773 K). A fabricated single-leg device achieves a conversion efficiency of ~10% under ∆T = 420 K, ranking among the top performances in the field. This work establishes a solid foundation for enhancing the performance and expanding the applications of GeTe-based TE materials.

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Journal of Advanced Ceramics
Article number: 9221258

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Cite this article:
Zhang Z, Mao F, Yao M, et al. Synergistic shallow impurity levels and multiscale defect engineering in GeTe-based thermoelectrics. Journal of Advanced Ceramics, 2026, 15(3): 9221258. https://doi.org/10.26599/JAC.2026.9221258

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Received: 26 December 2025
Revised: 31 January 2026
Accepted: 04 February 2026
Published: 18 March 2026
© The Author(s) 2026.

This is an open access article under the terms of the Creative Commons Attribution 4.0 International License (CC BY 4.0, http://creativecommons.org/licenses/by/4.0/).