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Perspective | Open Access

Device-level synchrotron-based operando characterization of electrochemistry at scale

Department of Chemistry and Chemical Biology, Cornell University, Ithaca, New York 14853, USA
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Abstract

Electrochemical energy conversion devices, such as fuel cells and water electrolyzers, offer high power densities and efficiencies, along with quiet, emission-free operation, making them attractive candidates for large-scale applications. Advancing these technologies requires the development of materials including catalysts, membranes, and diffusion media that can deliver the performance and durability metrics necessary for practical deployment. However, the true/relevant active states of materials often exist only under operating conditions of electrochemical devices, making them inaccessible to conventional ex situ characterization techniques. Thus, the characterization of electrochemical devices under operating conditions, namely operando, can offer critical and valuable insights for guiding/informing material development. Synchrotron-based hard X-ray (> 5 keV) techniques are particularly well-suited for operando characterization of electrochemical devices due to their high penetration depth and relatively weak interactions, enabling the probing of various internal components. The various synchrotron X-ray based characterization techniques can provide comprehensive information including chemical (valence) states, coordination environments, and structures across different length scales. The use of these techniques provides unique opportunities to capture active states of materials and track evolving dynamics. In this perspective, we provide an overview of the device-level operando characterization using synchrotron-based X-ray techniques and highlight its potential to inform and accelerate material development towards the large-scale deployment of electrochemical technologies.

Graphical Abstract

Operando characterization provides direct access to material states under electrochemical device operating conditions. Synchrotron-based X-ray techniques offer powerful advantages for enabling such measurements.

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Carbon Future
Article number: 9200059

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Cite this article:
Li Q, Abruña HD. Device-level synchrotron-based operando characterization of electrochemistry at scale. Carbon Future, 2025, 2(4): 9200059. https://doi.org/10.26599/CF.2025.9200059

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Received: 26 August 2025
Revised: 04 November 2025
Accepted: 11 November 2025
Published: 28 November 2025
© The author(s) 2025. Published by Tsinghua University Press.

Open AccessThis article is licensed under the terms of the Creative Commons Attribution 4.0 International License (http://creativecommons.org/licenses/by/4.0/), which permits use, sharing, distribution and reproduction in any medium, provided the original work is properly cited.