Reflective terahertz continuous wave linear array scanning imaging system

Utilizing a terahertz (THz) linear array detector and a 0.3 THz radiation source, a reflective THz continuous wave linear array scanning imaging system was built. Using the imaging system, THz images reflected by samples could be accurately measured with double scan measurements and an image linear superposition. The imaging resolution and the measurement region could approach 2 mm and 40 mm×40 mm with 3.0 min of the time consumption. Taking advantage of this system, the metallic samples hidden by envelopes and textiles were successively identified. In addition, the foreign matters embedded in polyethylene and plastic foam plates were exactly discerned. The experimental results demonstrated that objects concealed by dielectric materials can be quickly and precisely inspected by the imaging system, which indicated its application values in security inspection and non-destructive testing.