AI Chat Paper
Note: Please note that the following content is generated by AMiner AI. SciOpen does not take any responsibility related to this content.
{{lang === 'zh_CN' ? '文章概述' : 'Summary'}}
{{lang === 'en_US' ? '中' : 'Eng'}}
Chat more with AI
PDF (1.8 MB)
Collect
Submit Manuscript AI Chat Paper
Show Outline
Outline
Show full outline
Hide outline
Outline
Show full outline
Hide outline
Publishing Language: Chinese

Typical fault mechanism modeling and simulation analysis of insulin pump sets

Weijie WANG1Dinghui GUO1Xiangyu LI1( )Yixuan GENG2Long QUAN1
College of Mechanical and Vehicle Engineering,Taiyuan University of Technology,Taiyuan 030024,China
School of Automation Science and Electrical Engineering,Beihang University,Beijing 100191,China
Show Author Information

Abstract

An insulin pump is an advanced device used for intensive insulin therapy in diabetic patients. Failure of the insulin pump sets can disrupt normal insulin delivery, leading to abnormal blood glucose elevations and potentially causing diabetic ketoacidosis, which can be life-threatening. Establishing a mathematical model to describe the fault mechanisms of insulin pump sets is fundamental for its fault diagnosis. Insulin pumps, however, provide difficulties for modeling and fault mechanism analysis due to the stiff and elastic restrictions of the needles and tubes, as well as the multi-domain interactions between the fluid (insulin) and the solid parts of the pump. In response to these challenges, this paper establishes a mathematical model of fluid transmission in insulin pumps under both healthy and faulty conditions, based on power flow theory, focusing on two typical faults: blockages and leaks. The impact of these faults on fluid flow within the insulin pump sets is quantitatively analyzed. The computational results of the proposed model showed a maximum error of 0.57% when compared with professional fluid dynamics software simulations. Furthermore, the impact of varying degrees of leakage and blockage faults on the output flow rate and pressure of the insulin pump system is analyzed. Specifically, for blockage faults, it was observed that when the blockage layer thickness is less than 0.6 mm, the changes in insulin output flow rate and the pressure within the insulin pump chamber are not significant. However, the blockage has a considerable impact on both flow rate and pressure when the thickness of the blockage layer surpasses 0.6 mm. The impact grows with the thickness of the blockage layer.

CLC number: R318.6;TP391.9 Document code: A Article ID: 1001-5965(2026)07-2393-10

References

【1】
【1】
 
 
Journal of Beijing University of Aeronautics and Astronautics
Pages 2393-2402

{{item.num}}

Comments on this article

Go to comment

< Back to all reports

Review Status: {{reviewData.commendedNum}} Commended , {{reviewData.revisionRequiredNum}} Revision Required , {{reviewData.notCommendedNum}} Not Commended Under Peer Review

Review Comment

Close
Close
Cite this article:
WANG W, GUO D, LI X, et al. Typical fault mechanism modeling and simulation analysis of insulin pump sets. Journal of Beijing University of Aeronautics and Astronautics, 2026, 52(7): 2393-2402. https://doi.org/10.13700/j.bh.1001-5965.2024.0394

4

Views

0

Downloads

0

Crossref

0

Scopus

0

CSCD

Received: 04 June 2024
Published: 12 July 2024
© Journal of Beijing University of Aeronautics and Astronautics