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Publishing Language: Chinese

Fretting wear test and performance degradation model of electrical connector under step random vibration

Yanyan LUO1( )Qiaoshen QI1,2Yongpeng WANG3Xiongwei WU4
Provincial and Ministerial Co-construction Collaborative Innovation Center on Reliability Technology of Electrical Products,Hebei University of Technology,Tianjin 300401,China
State Grid Tianjin Electric Power Company Chengnan Power Supply Branch,Tianjin 300201,China
State Grid Shandong Electric Power Company Zouping Power Supply Company,Zouping 256200,China
State Grid Hebei Electric Power Company Handan New Area Power Supply Company,Handan 056000,China
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Abstract

In view of the problem that the electrical connector is subjected to step stress random vibration during operation, which leads to fretting wear of the electrical connector and the reduction of contact performance, the step stress random vibration test is carried out. The electrical capacitance tomography (ECT) is used to detect the characteristic value of wear debris between the electrical connector contacts in the process of fretting wear. Contact resistivity and the characteristic value of wear debris are used to study the wear degree and degradation law of contact performance under step stress random vibration conditions. The maximal information coefficient (MIC), which has good robustness and can characterize the nonlinear relationship, is introduced to analyze the correlation between the characteristic value of wear debris and contact resistance, and the dimension is reduced through mic screening to improve the prediction accuracy of the model. The findings demonstrate that under the random vibration of step stress, there is a stepped change trend in the contact resistance, the total characteristic values of wear debris, and the characteristic values of wear debris. Through the calculation of the maximum information coefficient, it is found that the total amount of wear debris characteristics is strongly correlated with the contact resistance. The results of energy spectrum analysis are consistent with the test results. The average absolute error of CHIO-Elman neural network performance degradation model optimized by MIC screening is less than 4%.

CLC number: TM501 Document code: A Article ID: 1001-5965(2026)07-2293-10

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Journal of Beijing University of Aeronautics and Astronautics
Pages 2293-2302

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Cite this article:
LUO Y, QI Q, WANG Y, et al. Fretting wear test and performance degradation model of electrical connector under step random vibration. Journal of Beijing University of Aeronautics and Astronautics, 2026, 52(7): 2293-2302. https://doi.org/10.13700/j.bh.1001-5965.2024.0350

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Received: 23 May 2024
Published: 25 June 2024
© Journal of Beijing University of Aeronautics and Astronautics