Mechanism of anomalies in operational amplifier induced by proton deep charge-discharge effects

When solar protons and galactic cosmic rays, the primary radiation environments in deep space, accumulate in the dielectric material, they can cause spacecraft electrostatic discharge induced by charging (SESD), which can cause abnormalities in electronic devices. The LM124 integrated operational amplifier are used to study the characteristics of anomalies. The H-simulation program with integrated circuit enphasis (HSPICE) simulation is used to study the SESD sensitive region and mechanism of anomalies. The findings suggest that the output pin may experience transients due to the SESD transient. The amplitude of the output transient is positively associated with the amplitude of the SESD transient, and the duration of the output transient is associated with the circuit operating state. The negative power pin is the SESD sensitive region. The current transient in the input-control transistors and gain transistors caused by SESD induces output voltage anomalies.