AI Chat Paper
Note: Please note that the following content is generated by AMiner AI. SciOpen does not take any responsibility related to this content.
{{lang === 'zh_CN' ? '文章概述' : 'Summary'}}
{{lang === 'en_US' ? '中' : 'Eng'}}
Chat more with AI
PDF (1,005.6 KB)
Collect
Submit Manuscript AI Chat Paper
Show Outline
Outline
Show full outline
Hide outline
Outline
Show full outline
Hide outline
Publishing Language: Chinese | Open Access

Key Technological Challenges and Collaborative Innovation Pathways of China's Integrated Circuits

Xiaoming Xiong1, Ruidian Zhan1, Bo Rao2, Xin Zheng1( ), Yuan Liu1
School of Integrated Circuits, Guangdong University of Technology, Guangzhou 510006, China
Niuxin semiconductor (Shenzhen) Co., Ltd., Shenzhen 518000, China
Show Author Information

Abstract

Against the backdrop of intensified global technological rivalry and restrictions on critical technologies, the Integrated Circuit (IC) industry has become central domain of national strategic security and technological self-reliance. This paper systematically reviews the development status of China's IC industry chain, focusing on key bottlenecks in design, manufacturing, Electronic Design Automation (EDA) tools, and advanced packaging. Based on an analysis of external pressures such as U.S.-led technology embargoes and internal structural weaknesses, the authors identify the dual challenges faced by the industry. Combined with the latest research practice in Artificial Intelligence (AI) hardware accelerators, hardware/software co-design, device modeling and simulation, and AI-assisted EDA, this paper proposes a technology breakthrough path driven by collaborative innovation, and explores new directions in computing architecture, system packaging, and EDA design under the post-Moore paradigm. This paper provides theoretical support and practical references for technological innovation and policy formulation in the integrated circuit field.

CLC number: TP332.1; TP319; TN402

References

【1】
【1】
 
 
Journal of Guangdong University of Technology
Pages 1-11

{{item.num}}

Comments on this article

Go to comment

< Back to all reports

Review Status: {{reviewData.commendedNum}} Commended , {{reviewData.revisionRequiredNum}} Revision Required , {{reviewData.notCommendedNum}} Not Commended Under Peer Review

Review Comment

Close
Close
Cite this article:
Xiong X, Zhan R, Rao B, et al. Key Technological Challenges and Collaborative Innovation Pathways of China's Integrated Circuits. Journal of Guangdong University of Technology, 2025, 42(6): 1-11. https://doi.org/10.12052/gdutxb.250119

1171

Views

14

Downloads

0

Crossref

Received: 25 June 2025
Accepted: 12 September 2025
Published: 25 September 2025
© 2025 Editorial Office of Journal of Guangdong University of Technology

This is an open access article under the CC BY-NC-ND license (https://creativecommons.org/licenses/by-nc-nd/4.0/).