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Publishing Language: Chinese | Open Access

Safe Diagnosis of Pattern Failure of Decentralized Stochastic Discrete Event Systems

School of Compute Science and Technology, Guangdong University of Technology, Guangzhou 510006, China
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Abstract

Most existing studies of decentralized stochastic discrete-event systems (SDESs) usually focused on faults caused by a single event, while in many practical applications, faults were usually resulted from the successive occurrence of a series of events. To address the problem of detecting such faults, in this paper, a pattern safe diagnosis method is proposed for decentralized SDESs. First, the notion of pattern safe codiagnosability of decentralized stochastic systems is formalized. Then, by constructing a pattern safe codiagnoser, a sufficient and necessary condition of pattern safe codiagnosability is presented based on the pattern safe codiagnoser for decentralized SDESs. As a result, the pattern safe diagnosis for decentralized SDESs can be performed.

CLC number: TP277

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Journal of Guangdong University of Technology
Pages 108-115

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Cite this article:
Huang Z-h, Liu F-c. Safe Diagnosis of Pattern Failure of Decentralized Stochastic Discrete Event Systems. Journal of Guangdong University of Technology, 2024, 41(2): 108-115. https://doi.org/10.12052/gdutxb.220174

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Received: 21 November 2022
Published: 01 March 2024
© 2024 Editorial Office of Journal of Guangdong University of Technology

This is an open access article under the CC BY-NC-ND license (https://creativecommons.org/licenses/by-nc-nd/4.0/).