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Publishing Language: Chinese | Open Access

Research progress of anti-irradiation MRAM

Jiejie SUN1,2,3Chao WANG2Jiawei LI2Chuanpeng JIANG1Kaihua CAO1 ( )Hui SHI2Youguang ZHANG3Weisheng ZHAO1
School of Integrated Circuit Science and Engineering, Beihang University, Beijing 100191, China
China Electronics Technology Group Corporation No.58 Research Institute, Wuxi 214072, China
School of Electronic and Information Engineering, Beihang University, Beijing 100191, China
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Abstract

The novel non-volatile MRAM (magnetic random access memory) has the advantages of fast read and write speed, long data retention time and low power consumption, which attracts wide attention from researchers. Its excellent anti-irradiation capabilities are explored in depth, and further applications in aerospace and other fields are expected. The industrial development, technological changes and applications of MRAM were reviewed, the mature MRAM products of recent years were listed, and the advantages and disadvantages of different generations of MRAM were analyzed. The radiation effects of MTJ(magnetic tunnel junction) and read/write circuit based CMOS (complementary metal oxide semiconductor) were discussed. The recent achievements in anti-radiative hardening design for MRAM were summarized. The development prospect of anti-irradiation MRAM in aerospace field and even nuclear energy field was prospected.

CLC number: TN4 Document code: A Article ID: 1001-2486(2023)06-174-22

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Journal of National University of Defense Technology
Pages 174-195

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Cite this article:
SUN J, WANG C, LI J, et al. Research progress of anti-irradiation MRAM. Journal of National University of Defense Technology, 2023, 45(6): 174-195. https://doi.org/10.11887/j.cn.202306020

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Received: 14 March 2022
Published: 01 December 2023
© 2023 Journal of National University of Defense Technology

This is an open access article under the CC BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/).