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Publishing Language: Chinese | Open Access

Development of Diamond Semiconductor Materials

Weiguo DONG1Jiaqi LIU1Zhaobin ZHANG1Xin KONG2,3Xihui CUI2,3Duanwei HE1( )
Institute of Atomic and Molecular Physics, Sichuan University, Chengdu 610065, Sichuan, China
The 29th Research Institute, China Electronics Technology Group Corporation, Chengdu 610036, Sichuan, China
Sichuan Engineering Research Center for High-Density Integration of Broadband Microwave Circuits, Chengdu 610036, Sichuan, China
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Abstract

Diamond has emerged as a quintessential representative of next-generation semiconductor materials, owing to its ultra-wide bandgap, exceptional thermal conductivity, high breakdown field strength, and outstanding carrier mobility. It has thus attracted extensive attention from fields such as power electronics, radio-frequency communications, and quantum information technologies. Intrinsic single-crystal diamond serves as the foundational substrate for diamond semiconductor development, requiring impurity concentrations at the parts per billion (ppb) level and extremely low dislocation densities. While the high-pressure high-temperature (HPHT) method yields material of higher purity and superior crystal quality, its utility is limited by small crystal dimensions. Consequently, HPHT-grown diamond is frequently employed as a substrate for chemical vapour deposition (CVD) homoepitaxy, enabling the preparation of large-area, high-quality single crystals. Regarding doping, the boron (B) atom, with a size difference of merely 6.5% compared to carbon (C), readily incorporates into the diamond lattice, facilitating the production of high-performance p-type diamond. Related devices, such as Schottky barrier diodes, have been successfully demonstrated. In contrast, n-type doping presents a fundamental challenge: potential dopants like phosphorus (P) and sulphur (S) possess atomic radii 35%–57% larger than carbon, making their incorporation and activation within the lattice exceedingly difficult. The ultra-high pressure and high-temperature diffusion method, which modulates this atomic size disparity under extreme pressures (e.g., about 15 GPa), emerges as a promising new pathway towards achieving shallow-level n-type doping. Concerning surface terminations, hydrogen termination induces a high-mobility two-dimensional hole gas (2DHG), whilst oxygen termination enhances interface stability and provides chemical passivation. However, their thermal stability windows (approximately 400 and 600 ℃, respectively) remain inferior to those of substitutionally doped diamond, limiting their application in high-temperature and high-frequency devices. Therefore, breakthroughs in n-type doping, enhanced thermal stability of surface terminations, and the development of large-area, cost-effective fabrication processes are critical to advancing diamond semiconductor technology towards commercialisation in power electronics, quantum technologies, and high-performance sensing. This review aims to analyse and discuss these pivotal issues, exploring both the prospects and the persistent challenges facing diamond semiconductor development.

CLC number: TN304; O521.2 Document code: A

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Chinese Journal of High Pressure Physics

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Cite this article:
DONG W, LIU J, ZHANG Z, et al. Development of Diamond Semiconductor Materials. Chinese Journal of High Pressure Physics, 2026, 40(9). https://doi.org/10.11858/gywlxb.20261113

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Received: 11 June 2026
Revised: 11 August 2026
Published: 05 September 2026
© 2026 Editorial Office of Chinese Journal of High Pressure Physics

This is an open access article under the CC BY-NC-ND license (https://creativecommons.org/licenses/by-nc/4.0/)