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Topical Review | Open Access

Assembly and integration of micro-led displays: a review of transfer methods targeting near-perfect yield

Seong Woo Hong1 Hyeon Ho Shin1 Seol Ahn1 Hyeon Ji Yang2 Kyung Jun Lee2 Myungwon Lee3 Ji Woong Cho1 Yei Hwan Jung1,2,3,4 ( )
Department of Electronic Engineering, Hanyang University, Seoul 04763, Republic of Korea
Department of Artificial Intelligence Semiconductor Engineering, Hanyang University, Seoul 04763, Republic of Korea
Division of Nanoscale Semiconductor Engineering, Hanyang University, Seoul 04763, Republic of Korea
Institute of Nano Science and Technology, Hanyang University, Seoul 04763, Republic of Korea
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Abstract

Micro-light-emitting diodes (micro-LEDs) are widely recognized for their superior brightness, efficiency, and durability, offering transformative potential for next-generation displays and emerging applications. However, the path to commercialization remains hindered by a critical barrier: achieving an extremely high production yield. Unlike conventional displays, micro-LED displays require the precise transfer of millions of individual micro-LED chips, even the slightest defects can significantly affect the overall yield. This review focuses on the technological challenges of pushing micro-LED assembly yield to extremely high thresholds of 99.99999%. We explore six key transfer methods—elastomeric transfer, roll-to-roll printing, electrostatic and electromagnetic assembly, laser transfer, microvacuum assembly, and fluidic self-assembly—and analyze their respective impacts on yield. Recent advancements in each method are discussed, with an emphasis on strategies to overcome yield challenges. By framing yield as the central metric and not as a side concern, this review aims to provide a roadmap for overcoming bottlenecks in micro-LED assembly and enabling industrial-scale deployment.

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International Journal of Extreme Manufacturing

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Cite this article:
Hong SW, Shin HH, Ahn S, et al. Assembly and integration of micro-led displays: a review of transfer methods targeting near-perfect yield. International Journal of Extreme Manufacturing, 2026, 8(2). https://doi.org/10.1088/2631-7990/ae25a8

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Received: 21 May 2025
Revised: 18 August 2025
Accepted: 28 November 2025
Published: 16 December 2025
© 2025 The Author(s).

Original content from this work may be used under the terms of the Creative Commons Attribution 4.0 licence. Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI.