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In situ SEM/EBSD characterization was utilized to monitor dislocation activation during the plastic deformation of the Mg-Y-Nd-Zr-Gd alloy. Through a correlative analysis of slip traces and crystal rotation, the active basal slip systems were precisely identified. It was initially observed that grains dominated by basal slip exhibit a coexistence of multiple basal slip systems during plastic deformation. Furthermore, the activated basal slip systems were found to exhibit pronounced non-Schmid behavior. Subsequently, through specific case analyses and comprehensive statistical evaluation, the limitations of the Schmid factor in predicting the activation of basal slip systems in the Mg-Y-Nd-Zr-Gd alloy were objectively assessed. It was further highlighted that the plastic transfer significantly promotes the activation of basal slip systems, particularly for individuals with low Schmid factors.
This is an open access article under the CC BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/)
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