Test Mismatch in Switched-Current Circuits Using Wavelet Analysis

Errors of mismatch and currents calibration caused by channel geometrical variety in switched-current are investigated in this paper. The relation and computing of mismatch and sensitivity are discussed also, and then a measure method of switched current mismatch using wavelet decomposition is proposed. A selected group of same transconductance is choosing as a cohort firstly, and the sensitivities of cohort in relation to the variation of transconductance are computed. Compared with the nominal deviation and tolerance borderline, the optimization and testing can be performed. As an example, a sixth order chebyshev low-pass filter is simulated and tested. The results have justified the reliability and feasibility of the method.