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Automatic Defect Detection in X-Ray Images Using Image Data Fusion

Yuan TIANDong DU( )Guorui CAILi WANGHua ZHANG
Key Laboratory for Advanced Materials Processing Technology of Ministry of Education, Department of Mechanical Engineering, Tsinghua University, Beijing 100084, China
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Abstract

Automatic defect detection in X-ray images is currently a focus of much research at home and abroad. The technology requires computerized image processing, image analysis, and pattern recognition. This paper describes an image processing method for automatic defect detection using image data fusion which synthesizes several methods including edge extraction, wave profile analyses, segmentation with dynamic threshold, and weld district extraction. Test results show that defects that induce an abrupt change over a predefined extent of the image intensity can be segmented regardless of the number, location, shape, or size. Thus, the method is more robust and practical than the current methods using only one method.

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Tsinghua Science and Technology
Pages 720-724

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Cite this article:
TIAN Y, DU D, CAI G, et al. Automatic Defect Detection in X-Ray Images Using Image Data Fusion. Tsinghua Science and Technology, 2006, 11(6): 720-724. https://doi.org/10.1016/S1007-0214(06)70255-3

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Received: 18 November 2005
Revised: 06 January 2006
Published: 01 December 2006
© Tsinghua University Press 2006