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The paper introduces a model of dielectric breakdown strength. The model integrated thermal breakdown and defect models, representing the relationship between the electric field of ferroelectric films and dimensional parameters and operating temperature. This model is verified with experimental results of the lead lanthanum zirconate titanate (PLZT) films of various film thickness (d = 0.8-3 μm), electrode area (A = 0.0020-25 mm2) tested under a range of operating temperature (T = 300-400 K) with satisfying fitting results. Also learned is a relationship that the recoverable electric energy density is directly proportional to the square of breakdown electric field. This relationship is found viable in predicting the electric energy density in terms of variables of d, A, and T for the PLZT films.


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Size and temperature effects on dielectric breakdown of ferroelectric films

Show Author's information Sheng TONG( )
DePaul University, 1 E. Jackson Blvd., Chicago, IL 60604, USA

Abstract

The paper introduces a model of dielectric breakdown strength. The model integrated thermal breakdown and defect models, representing the relationship between the electric field of ferroelectric films and dimensional parameters and operating temperature. This model is verified with experimental results of the lead lanthanum zirconate titanate (PLZT) films of various film thickness (d = 0.8-3 μm), electrode area (A = 0.0020-25 mm2) tested under a range of operating temperature (T = 300-400 K) with satisfying fitting results. Also learned is a relationship that the recoverable electric energy density is directly proportional to the square of breakdown electric field. This relationship is found viable in predicting the electric energy density in terms of variables of d, A, and T for the PLZT films.

Keywords:

film thickness, electrode size, ceramics, energy storage
Received: 29 July 2020 Revised: 15 September 2020 Accepted: 17 September 2020 Published: 18 January 2021 Issue date: February 2021
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Publication history

Received: 29 July 2020
Revised: 15 September 2020
Accepted: 17 September 2020
Published: 18 January 2021
Issue date: February 2021

Copyright

© The Author(s) 2020

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