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Rapid Communication | Open Access

Size and temperature effects on dielectric breakdown of ferroelectric films

DePaul University, 1 E. Jackson Blvd., Chicago, IL 60604, USA
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Abstract

The paper introduces a model of dielectric breakdown strength. The model integrated thermal breakdown and defect models, representing the relationship between the electric field of ferroelectric films and dimensional parameters and operating temperature. This model is verified with experimental results of the lead lanthanum zirconate titanate (PLZT) films of various film thickness (d = 0.8-3 μm), electrode area (A = 0.0020-25 mm2) tested under a range of operating temperature (T = 300-400 K) with satisfying fitting results. Also learned is a relationship that the recoverable electric energy density is directly proportional to the square of breakdown electric field. This relationship is found viable in predicting the electric energy density in terms of variables of d, A, and T for the PLZT films.

Keywords

film thicknesselectrode sizeceramicsenergy storage

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Journal of Advanced Ceramics
Volume 10 Issue 1,
February 2021
Pages 181-186
DOI: 10.1007/s40145-020-0426-1

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TONG S. Size and temperature effects on dielectric breakdown of ferroelectric films. Journal of Advanced Ceramics, 2021, 10(1): 181-186. https://doi.org/10.1007/s40145-020-0426-1

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Received: 29 July 2020
Revised: 15 September 2020
Accepted: 17 September 2020
Published: 18 January 2021
© The Author(s) 2020

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