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Yttria-stabilized zirconia (YSZ, ZrO2–8%Y2O3) films were deposited onto lanthanum strontium manganite (LSM, La0.7Sr0.3MnO3) substrates using dip-coating process aiming for the application in solid oxide fuel cells (SOFCs). YSZ precursor was prepared by sol–gel method; three values of the organic/inorganic concentration ratio (1, 3 and 5) were utilized and the sol viscosity was adjusted (60 mPa·s and 100 mPa·s) before deposition on the substrate. The influence of these synthesis parameters on the structure and morphology of the deposited films was examined by X-ray diffraction (XRD) and scanning electron microscopy (SEM). The films showed characteristic peaks of LSM, YSZ (with cubic structure) and secondary phases of SrZrO3 and La2O3. Depending on the synthesis conditions, crack-free, homogeneous and well adhered films were obtained, with thickness of 11–24 μm.


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Characterization of yttria-stabilized zirconia films deposited by dip-coating on La0.7Sr0.3MnO3 substrate: Influence of synthesis parameters

Show Author's information Jacqueline C. MARREROaNielson F. P. RIBEIROaCélia F. MALFATTIbMariana M. V. M. SOUZA*,a( )
Escola de Química—Universidade Federal do Rio de Janeiro (UFRJ), Centro de Tecnologia, Bloco E, sala 206, Ilha do Fundão, CEP 21941-909, Rio de Janeiro, RJ, Brazil
Departamento de Metalurgia, Universidade Federal do Rio Grande do Sul (UFRGS), Campus do Vale, Setor 4, Prédio 75, Sala 234, CEP 91501-970, Porto Alegre, RS, Brazil

Abstract

Yttria-stabilized zirconia (YSZ, ZrO2–8%Y2O3) films were deposited onto lanthanum strontium manganite (LSM, La0.7Sr0.3MnO3) substrates using dip-coating process aiming for the application in solid oxide fuel cells (SOFCs). YSZ precursor was prepared by sol–gel method; three values of the organic/inorganic concentration ratio (1, 3 and 5) were utilized and the sol viscosity was adjusted (60 mPa·s and 100 mPa·s) before deposition on the substrate. The influence of these synthesis parameters on the structure and morphology of the deposited films was examined by X-ray diffraction (XRD) and scanning electron microscopy (SEM). The films showed characteristic peaks of LSM, YSZ (with cubic structure) and secondary phases of SrZrO3 and La2O3. Depending on the synthesis conditions, crack-free, homogeneous and well adhered films were obtained, with thickness of 11–24 μm.

Keywords:

YSZ, films, LSM, sol–gel, dip-coating
Received: 29 December 2012 Revised: 24 January 2013 Accepted: 26 January 2013 Published: 06 April 2013 Issue date: March 2013
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Publication history

Received: 29 December 2012
Revised: 24 January 2013
Accepted: 26 January 2013
Published: 06 April 2013
Issue date: March 2013

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© The author(s) 2013

Acknowledgements

The authors thank CAPES for financial support to carry out this work.

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