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Research Article

Emission wavelength selection via anomalous polarized fluorescence in ZnO-C nanowires

Joon Kiat KangKim Yong Lim( )Chorng Haur Sow( )
Department of Physics, National University of Singapore, Singapore 117542, Singapore
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Abstract

Defect fluorescence from high aspect ratio semiconductor nanowires typically displays a weak polarization parallel to the nanowire’s long axis due to dielectric mismatch in high aspect ratio media. Instead, anomalous 2.2 eV defect fluorescence distinctly polarized perpendicular to the nanowire is observed and measured from carbon-incorporated zinc oxide nanowires. These observations are significant because polarized defect emissions with consistent polarization on a mesoscopic scale are uncommon. Through a systematic study and comparison of experimental results with density functional theory calculations, an oriented defect complex comprising carbon substituting on an oxygen site and an oxygen vacancy (CO-VO) is deduced to be responsible for the anomalous yellow fluorescence, demonstrating a method for relating atomic-scale defect geometry to mesoscopic properties. The anomalous emission can appear in both green- and red-fluorescing nanowires grown with different carbon concentrations, verifying the independence and uniqueness of the 2.2 eV emission. This allows for polarization-dependent emission wavelength selection from a single nanowire.

Graphical Abstract

ZnO-C nanowires displayed 2.2 eV defect fluorescence with anomalous polarization perpendicular to the long axis, offering a method for polarization-dependent emission wavelength selection from a single nanowire. The distinct polarization was attributed to oriented CO-VO point defects after comparison with density functional theory calculations.

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Nano Research
Pages 4489-4497

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Cite this article:
Kang JK, Lim KY, Sow CH. Emission wavelength selection via anomalous polarized fluorescence in ZnO-C nanowires. Nano Research, 2024, 17(5): 4489-4497. https://doi.org/10.1007/s12274-023-6242-5
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Received: 02 August 2023
Revised: 21 September 2023
Accepted: 02 October 2023
Published: 04 November 2023
© Tsinghua University Press 2023