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Nano Research 2024, 17(4): 2988-2993 https://doi.org/10.1007/s12274-023-6217-6
Research Article | Issue | Published: 20 October 2023

Metal–organic framework wafer enabled fast response radiation detection with ultra-low dark current

Show Author's Information Meng Xu,  Jianxi Liu( ),  Wei Wu,  Yang Chen,  Donghao Ma,  Sixin Chen,  Wanqi Jie,  Menghua Zhu( ),  Yadong Xu( )
State Key Laboratory of Solidification Processing, MIIT Key Laboratory of Radiation Detection Materials and Devices, & School of Materials Science and Engineering, Northwestern Polytechnical University, Xi’an 710072, China
Keywords:
lead-free, MOFs, fast response, X-ray detection and imaging, dark current, α-particles
Topics:
Nano detection
Cite this article:
Xu M, Liu J, Wu W, et al. Metal–organic framework wafer enabled fast response radiation detection with ultra-low dark current. Nano Research, 2024, 17(4): 2988-2993. https://doi.org/10.1007/s12274-023-6217-6
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Abstract Full text Electronic supplementary material About this article

Semiconductive metal–organic frameworks (MOFs) have attracted great interest for the electronic applications. However, dark currents of present hybrid organic–inorganic materials are 1000–10,000 times higher than those of commercial inorganic detectors, leading to poor charge transportation. Here, we demonstrate a ZIF-8 (Zn(mim)2, mim = 2-methylimidazolate) wafer with ultra-low dark current of 1.27 pA·mm−2 under high electric fields of 322 V·mm−1. The isostatic pressing preparation process provides ZIF-8 wafers with good transmittance. Besides, the presence of redox-active metals and small spatial separation between components promotes the charge hopping. The ZIF-8-based semiconductor detector shows promising X-ray detection sensitivity of 70.82 μC·Gy−1·cm−2 with low doses exposures, contributing to superior X-ray imaging capability with a relatively high spatial resolution of 1.2 lp·mm−1. Simultaneously, good peak discrimination with the energy resolution of ~ 43.78% is disclosed when the detector is illuminated by uncollimated 241Am@5.48 MeV α-particles. These results provide a broad prospect of MOFs for future radiation detection applications.


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Electronic supplementary material
About this article

Metal–organic framework wafer enabled fast response radiation detection with ultra-low dark current

Show Author's information Meng Xu, Jianxi Liu( ), Wei Wu, Yang Chen, Donghao Ma, Sixin Chen, Wanqi Jie, Menghua Zhu( ), Yadong Xu( )
State Key Laboratory of Solidification Processing, MIIT Key Laboratory of Radiation Detection Materials and Devices, & School of Materials Science and Engineering, Northwestern Polytechnical University, Xi’an 710072, China

Abstract

Semiconductive metal–organic frameworks (MOFs) have attracted great interest for the electronic applications. However, dark currents of present hybrid organic–inorganic materials are 1000–10,000 times higher than those of commercial inorganic detectors, leading to poor charge transportation. Here, we demonstrate a ZIF-8 (Zn(mim)2, mim = 2-methylimidazolate) wafer with ultra-low dark current of 1.27 pA·mm−2 under high electric fields of 322 V·mm−1. The isostatic pressing preparation process provides ZIF-8 wafers with good transmittance. Besides, the presence of redox-active metals and small spatial separation between components promotes the charge hopping. The ZIF-8-based semiconductor detector shows promising X-ray detection sensitivity of 70.82 μC·Gy−1·cm−2 with low doses exposures, contributing to superior X-ray imaging capability with a relatively high spatial resolution of 1.2 lp·mm−1. Simultaneously, good peak discrimination with the energy resolution of ~ 43.78% is disclosed when the detector is illuminated by uncollimated 241Am@5.48 MeV α-particles. These results provide a broad prospect of MOFs for future radiation detection applications.

Keywords: lead-free, MOFs, fast response, X-ray detection and imaging, dark current, α-particles

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Publication history
Copyright
Acknowledgements

Publication history

Received: 08 August 2023
Revised: 18 September 2023
Accepted: 18 September 2023
Published: 20 October 2023
Issue date: April 2024

Copyright

© Tsinghua University Press 2023

Acknowledgements

Acknowledgements

This work was supported by the National Natural Science Foundations of China (Nos. U2032170 and 62104194). The project was also supported by the Natural Science Basic Research Plan in Shaanxi Province of China (No. 2021GXLH-01-03), the ND Basic Research Funds (No. G2022WD), and the Research Fund of the State Key Laboratory of Solidification Processing (NPU), China (No. 2022-TS-07).

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