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Nano Research 2023, 16(7): 10047-10052 https://doi.org/10.1007/s12274-023-5704-0
Research Article | Issue | Published: 10 May 2023

Substrate orientation effect in covalent organic frameworks/2D materials heterostructure by high-resolution atomic force microscopy

Show Author's Information Lu Wang1,2,  Cheng Lu1,2,  Huijuan Yan1,2,  Dong Wang1,2( )
CAS Key Laboratory of Molecular Nanostructure and Nanotechnology, CAS Research/Education Center for Excellence in Molecular Sciences, Beijing National Laboratory for Molecular Science (BNLMS), Institute of Chemistry, Chinese Academy of Sciences, Beijing 100190, China
University of Chinese Academy of Sciences, Beijing 100049, China
Keywords:
on-surface synthesis, covalent organic frameworks (COFs), substrate orientation effect, high-resolution atomic force microscopy (HR-AFM)
Topics:
Scanning probe microscopySurface structure
Cite this article:
Wang L, Lu C, Yan H, et al. Substrate orientation effect in covalent organic frameworks/2D materials heterostructure by high-resolution atomic force microscopy. Nano Research, 2023, 16(7): 10047-10052. https://doi.org/10.1007/s12274-023-5704-0
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Abstract Full text Electronic supplementary material About this article

Heterostructures based on covalent organic frameworks (COFs) and other two-dimensional (2D) materials attract considerable attention due to their extraordinary properties and tremendous application potential. Substrate effects play a crucial role in the integration of ultrathin COF films onto 2D materials through direct polymerization. In this study, highly ordered monolayer COFs were successfully constructed on the surfaces of highly oriented pyrolytic graphite (HOPG), hexagonal boron nitride (hBN), and molybdenum disulfide (MoS2). High-resolution atomic force microscopy (HR-AFM) imaging clearly reveals the substrate orientation effect in COFs/2D materials heterostructure. Honeycomb networks formed via Schiff-base reaction and boronic acid condensation reaction can epitaxially grow in specific orientations relative to the underlying substrate lattices. This work provides direct evidence for substrate effects in the on-surface synthesis of COFs and paves the way for further investigation into the intrinsic electronic properties of monolayer COFs and the development of multifunctional hybrid devices.


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About this article

Substrate orientation effect in covalent organic frameworks/2D materials heterostructure by high-resolution atomic force microscopy

Show Author's information Lu Wang1,2, Cheng Lu1,2, Huijuan Yan1,2, Dong Wang1,2( )
CAS Key Laboratory of Molecular Nanostructure and Nanotechnology, CAS Research/Education Center for Excellence in Molecular Sciences, Beijing National Laboratory for Molecular Science (BNLMS), Institute of Chemistry, Chinese Academy of Sciences, Beijing 100190, China
University of Chinese Academy of Sciences, Beijing 100049, China

Abstract

Heterostructures based on covalent organic frameworks (COFs) and other two-dimensional (2D) materials attract considerable attention due to their extraordinary properties and tremendous application potential. Substrate effects play a crucial role in the integration of ultrathin COF films onto 2D materials through direct polymerization. In this study, highly ordered monolayer COFs were successfully constructed on the surfaces of highly oriented pyrolytic graphite (HOPG), hexagonal boron nitride (hBN), and molybdenum disulfide (MoS2). High-resolution atomic force microscopy (HR-AFM) imaging clearly reveals the substrate orientation effect in COFs/2D materials heterostructure. Honeycomb networks formed via Schiff-base reaction and boronic acid condensation reaction can epitaxially grow in specific orientations relative to the underlying substrate lattices. This work provides direct evidence for substrate effects in the on-surface synthesis of COFs and paves the way for further investigation into the intrinsic electronic properties of monolayer COFs and the development of multifunctional hybrid devices.

Keywords: on-surface synthesis, covalent organic frameworks (COFs), substrate orientation effect, high-resolution atomic force microscopy (HR-AFM)

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Publication history
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Acknowledgements

Publication history

Received: 11 January 2023
Revised: 23 March 2023
Accepted: 02 April 2023
Published: 10 May 2023
Issue date: July 2023

Copyright

© Tsinghua University Press 2023

Acknowledgements

Acknowledgements

This work is supported by the National Natural Science Foundation of China (Nos. 21972147 and 22132007), the Key Research Program of the Chinese Academy of Sciences (No. XDPB01). The Supercomputing Environment of the Chinese Academy of Sciences is acknowledged for providing computational resources.

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