A dual-use probe for nano-metric photoelectric characterization using a confined light field generated by photonic crystals in the cantilever

We propose a plasmonic atomic force microscopy (AFM) probe, which takes a part of the laser beam for monitoring cantilever deflection as the excitation light source. Photonic crystal cavities are integrated near the cantilever's free end where the laser spot locates. The transmitted light excites surface plasmon polaritons on the metal-coated tip and induces a confined hot-spot at the tip apex. Numerical simulations demonstrate that the plasmonic probe can couple a tilted, linearly polarized beam efficiently and yield a remarkable local electromagnetic enhancement with the intensity being around 21 times stronger than that of the original probe. For demonstration, we employ the plasmonic probe in electrostatic force microscopy and scanning Kelvin probe microscopy to study the impact of local light field on the photoelectric characteristics of SiO₂ and Au nanoparticles. Compared with the original probe, obvious differences are observed in the electrostatic force gradients on SiO₂ nanoparticles and in the surface potentials of Au nanoparticles. The plasmonic probe can enable AFM as a powerful tool for simultaneous optical, mechanical and electrical characterizations.