Journal Home > Volume 14 , issue 3

The thickness of two-dimensional (2D) nanomaterials shows a significant effect on their optical and electrical properties. Therefore, a rapid and automatic detection technology of 2D nanomaterials with desired layer-number is required to extend their practical application in optoelectronic devices. In this paper, an image recognition technology was proposed for rapid and reliable identification of thin-layer WS2 samples, which combining a layer-thickness identification criterion and a novel image segmentation algorithm. The criterion stemmed from optical contrast study of monochromatic illumination photographs, and the algorithm was based on Canny operator and edge connection iteration. This optical identification method can seek out thin-layer WS2 samples on complex surfaces, which provides a promising approach for automatic search of thin-layer nanomaterials.

File
12274_2020_3122_MOESM1_ESM.pdf (1.3 MB)
Publication history
Copyright
Acknowledgements
Rights and permissions

Publication history

Received: 04 August 2020
Revised: 09 September 2020
Accepted: 15 September 2020
Published: 01 March 2021
Issue date: March 2021

Copyright

© Tsinghua University Press and Springer-Verlag GmbH Germany, part of Springer Nature

Acknowledgements

We acknowledge support from the National Natural Science Foundation of China (nos. 51527901, 11890672, and 51705285).

Rights and permissions

Reprints and Permission requests may be sought directly from editorial office.
Email: nanores@tup.tsinghua.edu.cn

Return