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Nano Research 2019, 12(4): 939-946 https://doi.org/10.1007/s12274-019-2328-5
Research Article | Open Access | Issue | Published: 12 March 2019

Analysis of structural distortion in Eshelby twisted InP nanowires by scanning precession electron diffraction

Show Author's Information Daniel Ugarte1,2( ),  Luiz H. G. Tizei3,  Monica A. Cotta1,  Caterina Ducati2,  Paul A. Midgley2,  Alexander S. Eggeman2,4( )
Instituto de Física "Gleb Wataghin",Universidade Estadual de Campinas-UNICAMP,Campinas-SP,CEP 13083-859,Brazil;
Department of Materials Science and Metallurgy,University of Cambridge,Cambridge,CB3 0FS,UK;
Laboratoire de Physique des Solides,CNRS UMR8502, Univ. Paris Sud,Orsay,91405,France;
School of Materials,University of Manchester,Manchester,M13 9PL,UK;
Keywords:
electron microscopy, nanowire, indium phosphide, scanning precession electron diffraction, Eshelby twist, screw dislocation
Topics:
Crystal orientationElectron diffractionElectron microscopyIIIIndium phosphideNanowiresScanningScanning electron microscopySemiconducting indium phosphide Transmission electron microscopyV semiconductorsZinc sulfide
Cite this article:
Ugarte D, Tizei LHG, Cotta MA, et al. Analysis of structural distortion in Eshelby twisted InP nanowires by scanning precession electron diffraction. Nano Research, 2019, 12(4): 939-946. https://doi.org/10.1007/s12274-019-2328-5
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Abstract Full text Electronic supplementary material About this article

Transmission electron microscopes (TEM) are widely used in nanotechnology research. However, it is still challenging to characterize nanoscale objects; their small size coupled with dynamical diffraction makes interpreting real- or reciprocal-space data difficult. Scanning precession electron diffraction ((S)PED) represents an invaluable contribution, reducing the dynamical contributions to the diffraction pattern at high spatial resolution. Here a detailed analysis of wurtzite InP nanowires (30-40 nm in diameter) containing a screw dislocation and an associated wire lattice torsion is presented. It has been possible to characterize the dislocation with great detail (Burgers and line vector, handedness). Through careful measurement of the strain field and comparison with dynamical electron diffraction simulations, this was found to be compatible with a Burgers vector modulus equal to one hexagonal lattice cell parameter despite the observed crystal rotation rate being larger (ca. 20%) than that predicted by classical elastic theory for the nominal wire diameter. These findings corroborate the importance of the (S)PED technique for characterizing nanoscale materials.


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About this article

Analysis of structural distortion in Eshelby twisted InP nanowires by scanning precession electron diffraction

Show Author's information Daniel Ugarte1,2( ), Luiz H. G. Tizei3, Monica A. Cotta1, Caterina Ducati2, Paul A. Midgley2, Alexander S. Eggeman2,4( )
Instituto de Física "Gleb Wataghin",Universidade Estadual de Campinas-UNICAMP,Campinas-SP,CEP 13083-859,Brazil;
Department of Materials Science and Metallurgy,University of Cambridge,Cambridge,CB3 0FS,UK;
Laboratoire de Physique des Solides,CNRS UMR8502, Univ. Paris Sud,Orsay,91405,France;
School of Materials,University of Manchester,Manchester,M13 9PL,UK;

Abstract

Transmission electron microscopes (TEM) are widely used in nanotechnology research. However, it is still challenging to characterize nanoscale objects; their small size coupled with dynamical diffraction makes interpreting real- or reciprocal-space data difficult. Scanning precession electron diffraction ((S)PED) represents an invaluable contribution, reducing the dynamical contributions to the diffraction pattern at high spatial resolution. Here a detailed analysis of wurtzite InP nanowires (30-40 nm in diameter) containing a screw dislocation and an associated wire lattice torsion is presented. It has been possible to characterize the dislocation with great detail (Burgers and line vector, handedness). Through careful measurement of the strain field and comparison with dynamical electron diffraction simulations, this was found to be compatible with a Burgers vector modulus equal to one hexagonal lattice cell parameter despite the observed crystal rotation rate being larger (ca. 20%) than that predicted by classical elastic theory for the nominal wire diameter. These findings corroborate the importance of the (S)PED technique for characterizing nanoscale materials.

Keywords: electron microscopy, nanowire, indium phosphide, scanning precession electron diffraction, Eshelby twist, screw dislocation

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Publication history

Received: 11 October 2018
Revised: 17 January 2019
Accepted: 04 February 2019
Published: 12 March 2019
Issue date: April 2019

Copyright

© The Authors(s) 2019

Acknowledgements

Acknowledgements

We thank Dr Z. Saghi for taking the ADF-STEM images of the twisted wires. D. U. acknowledges financial support from the Brazilian Agencies FAPESP (No. 2014/01045-0) and CNPq (No. 302767/2012-6). A. E. acknowledges funding from the Royal Society. P. A. M. acknowledges financial support from European Research Council through grant 291522-3DIMAGE and the EPSRC grant number EP/R025517/1. M. A. C. acknowledges financial support from FAPESP (Nos. 2013/02300-1 and 2013/10957-0) and CNPq (No. 479486/ 2012-3). L. H. G. T. and P. A. M. acknowledge funding from the European Union Seventh Framework Programme (FP7/2007-2013) under Grant Agreement No. 312483 (ESTEEM2).

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