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Research Article

Highly sensitive phototransistors based on two-dimensional GaTe nanosheets with direct bandgap

Pingan Hu1( )Jia Zhang1Mina Yoon2Xiao-Fen Qiao3Xin Zhang3Wei Feng1Pingheng Tan3( )Wei Zheng1Jingjing Liu1Xiaona Wang1Juan C. Idrobo2David B. Geohegan2Kai Xiao2( )
Key Lab of Microsystem and MicrostructureHarbin Institute of TechnologyMinistry of Education, No. 2 Yikuang StreetHarbin150080China
Center for Nanophase Materials SciencesOak Ridge National Laboratory, One Bethel Valley Road, Oak RidgeTN37831USA
State Key Laboratory of Superlattices and MicrostructuresInstitute of SemiconductorsChinese Academy of SciencesBeijing100083China
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Abstract

Highly sensitive phototransistors based on two-dimensional (2D) GaTe nanosheet have been demonstrated. The performance (photoresponsivity, detectivity) of the GaTe nanosheet phototransistor can be efficiently adjusted by using the applied gate voltage. The devices exhibit an ultrahigh photoresponsivity of 274.3 AW-1. The detectivity of 2D GaTe devices is ~1012 Jones, which surpasses that of currently-exploited InGaAs photodetectors (1011-1012 Jones). To reveal the origin of the enhanced photocurrent in GaTe nanosheets, theoretical modeling of the electronic structures was performed to show that GaTe nanosheets also have a direct bandgap structure, which contributes to the promotion of photon absorption and generation of excitons. This work shows that GaTe nanosheets are promising materials for high performance photodetectors.

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Nano Research
Pages 694-703

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Cite this article:
Hu P, Zhang J, Yoon M, et al. Highly sensitive phototransistors based on two-dimensional GaTe nanosheets with direct bandgap. Nano Research, 2014, 7(5): 694-703. https://doi.org/10.1007/s12274-014-0430-2

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Received: 04 January 2014
Revised: 15 February 2014
Accepted: 17 February 2014
Published: 23 April 2014
© Tsinghua University Press and Springer-Verlag Berlin Heidelberg 2014