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Characterizing the three-dimensional (3D) shape of a nanostructure by conventional imaging techniques in scanning electron microscopy and transmission electron microscopy can be limited or complicated by various factors, such as two-dimensional (2D) projection, diffraction contrast and unsure orientation of the nanostructure with respect to the electron beam direction. In this paper, in conjunction with electron diffraction and imaging, the 3D morphologies of ZnO nanowires and nanobelts synthesized via vapor deposition were reconstructed by electron tomography in a scanning transmission electron microscope (STEM). The cross-sections of these one-dimensional (1D) nanostructures include triangle, hexagonal, and rectangle shapes. By combining the reconstructed shape with the crystalline information supplied by electron diffraction patterns recorded from the same nanowire/nanobelt, the growth direction and its exposed surfaces were uniquely identified. In total, three different growth directions were confirmed. These directions are < 0001 > , < 2
The TEM used in this work is supported by the National Science Foundation (NSF) (DMR 0922776 and 0946418), and the Knowledge Innovation Program of the Chinese Academy of Sciences (Grant No. KJCX2-YW-M13).