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Research Article

Characteristics and Effects of Diffused Water Between Graphene and a SiO2 Substrate

Mi Jung Lee1,§Jin Sik Choi1,§Jin-Soo Kim1Ik-Su Byun1Duk Hyun Lee1Sunmin Ryu2Changgu Lee3( )Bae Ho Park1( )
Division of Quantum Phases & DevicesDepartment of PhysicsKonkuk UniversitySeoul143-701Korea
Department of Applied ChemistryKyung Hee University, YonginGyeonggi446-701Korea
Department of Mechanical EngineeringSungkyunkwan UniversitySuwon440-746Korea

§ These authors contributed equally to this work.

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Abstract

The graphene/SiO2 system is a promising building block for next-generation electronic devices, integrating the high electromagnetic performance of graphene with the mature technology of Si-based electronic devices. It is well known that the electromagnetic performance of graphene/SiO2 is dramatically reduced by structural defects, such as wrinkles and folding, which are suspected to result from water droplets. Therefore, understanding water diffusion between graphene and SiO2 is required for controlling structural defects and thus improving the electromagnetic performance of this system. Although the behavior of water between graphene and atomically flat mica has been investigated, the characteristics and effects of diffused water between graphene and SiO2 remain unidentified. We have investigated water diffusion between monolayer graphene and SiO2 under high humidity conditions using atomic force microscopy. For a relative humidity of over 90%, water diffuses into graphene/SiO2 and forms an ice-like structure up to two layers thick. Liquid-like water can further diffuse in, stacking over the ice-like layer and evaporating relatively easily in the air causing graphene to wrinkle and fold. By similarly investigating water diffusion between graphene and mica, we argue that water-induced wrinkle formation depends on the hydrophilicity and roughness of the substrate.

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Nano Research
Pages 710-717

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Cite this article:
Lee MJ, Choi JS, Kim J-S, et al. Characteristics and Effects of Diffused Water Between Graphene and a SiO2 Substrate. Nano Research, 2012, 5(10): 710-717. https://doi.org/10.1007/s12274-012-0255-9

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Received: 27 June 2012
Revised: 23 August 2012
Accepted: 27 August 2012
Published: 21 September 2012
© Tsinghua University Press and Springer-Verlag Berlin Heidelberg 2012