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Semiconducting single-walled carbon nanotubes (s-SWNTs) with a purity of ~98% have been obtained by gel filtration of arc-discharge grown SWNTs with diameters in the range 1.2–1.6 nm. Multi-laser Raman spectroscopy confirmed the presence of less than 2% of metallic SWNTs (m-SWNTs) in the s-SWNT enriched sample. Measurement of ~50 individual tubes in Pd-contacted devices with channel length 200 nm showed on/off ratios of > 104, conductances of 1.38–5.8 μS, and mobilities in the range 40–150 cm2/(V·s). Short channel multi-tube devices with ~100 tubes showed lower on/off ratios due to residual m-SWNTs, although the on-current was greatly increased relative to the devices made from individual tubes.


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Short Channel Field-Effect Transistors from Highly Enriched Semiconducting Carbon Nanotubes

Show Author's information Justin Wu1Liming Xie1Guosong Hong1Hong En Lim2Boanerges Thendie2Yasumitsu Miyata2Hisanori Shinohara2Hongjie Dai1( )
Department of Chemistry Stanford University Stanford CA 94305 USA
Department of Chemistry and Institute for Advanced Research Nagoya UniversityNagoya 464-8602 Japan

Abstract

Semiconducting single-walled carbon nanotubes (s-SWNTs) with a purity of ~98% have been obtained by gel filtration of arc-discharge grown SWNTs with diameters in the range 1.2–1.6 nm. Multi-laser Raman spectroscopy confirmed the presence of less than 2% of metallic SWNTs (m-SWNTs) in the s-SWNT enriched sample. Measurement of ~50 individual tubes in Pd-contacted devices with channel length 200 nm showed on/off ratios of > 104, conductances of 1.38–5.8 μS, and mobilities in the range 40–150 cm2/(V·s). Short channel multi-tube devices with ~100 tubes showed lower on/off ratios due to residual m-SWNTs, although the on-current was greatly increased relative to the devices made from individual tubes.

Keywords: Raman spectroscopy, field-effect transistor, separation, Single-walled carbon nanotubes

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Publication history
Copyright

Publication history

Received: 09 April 2012
Accepted: 15 April 2012
Published: 06 May 2012
Issue date: June 2012

Copyright

© Tsinghua University Press and Springer-Verlag Berlin Heidelberg 2012
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