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Research Article

Effect of carbon nanotube network morphology on thin film transistor performance

Marina Y. Timmermans1( )David Estrada2Albert G. Nasibulin1( )Joshua D. Wood2,3Ashkan Behnam2Dong-ming Sun4Yutaka Ohno4Joseph W. Lyding2,3Abdou Hassanien5,6Eric Pop2,3Esko I. Kauppinen1( )
NanoMaterials GroupDepartment of Applied Physics & Center for New MaterialsAalto University00076Espoo, Finland
Department of Electrical & Computer Eng.Micro & Nanotechnology LabUniversity of IllinoisUrbanaIL61801USA
Beckman InstituteUniversity of IllinoisUrbanaIL61801USA
Department of Quantum EngineeringNagoya UniversityNagoya464-8603Japan
National Institute of Chemistry19 Hajdrihova1000Ljubljana, Slovenia
Electronics and Photonics Research InstituteAIST1-1-1 UmezonoTsukubaIbaraki ken305-8568Japan
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Abstract

The properties of electronic devices based on carbon nanotube networks (CNTNs) depend on the carbon nanotube (CNT) deposition method used, which can yield a range of network morphologies. Here, we synthesize single-walled CNTs using an aerosol (floating catalyst) chemical vapor deposition process and deposit CNTs at room temperature onto substrates as random networks with various morphologies. We use four CNT deposition techniques: electrostatic or thermal precipitation, and filtration through a filter followed by press transfer or dissolving the filter. We study the mobility using pulsed measurements to avoid hysteresis, the on/off ratio, and the electrical noise properties of the CNTNs, and correlate them to the network morphology through careful imaging. Among the four deposition methods thermal precipitation is found to be a novel approach to prepare high-performance, partially aligned CNTNs that are dry-deposited directly after their synthesis. Our results provide new insight into the role of the network morphologies and offer paths towards tunable transport properties in CNT thin film transistors.

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Nano Research
Pages 307-319

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Cite this article:
Timmermans MY, Estrada D, Nasibulin AG, et al. Effect of carbon nanotube network morphology on thin film transistor performance. Nano Research, 2012, 5(5): 307-319. https://doi.org/10.1007/s12274-012-0211-8

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Received: 24 January 2012
Revised: 12 March 2012
Accepted: 12 March 2012
Published: 11 May 2012
© Tsinghua University Press and Springer-Verlag Berlin Heidelberg 2012