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Keyword: charge trapping
Research Article
The origin of gate bias stress instability and hysteresis in monolayer WS2 transistors
Changyong Lan, Xiaolin Kang, You Meng, [...], Renjie Wei, Xiuming Bu, SenPo Yip, Johnny C. Ho << Fewer
Published: 05 September 2020
2020, 13 (12): 3278-3285
Research Article
Excitation-assisted pseudo-ferroelectric effect in ultrathin graphene/phosphorene heterostructure
Huan Lu, Wanlin Guo
Published: 25 April 2023
2023, 16 (11): 12587-12593
Total 2