Nano Research

ISSN 1998-0124 e-ISSN 1998-0000 CN 11-5974/O4
Editors-in-Chief: Yadong Li, Shoushan Fan
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Keyword: computer simulation
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Research Article
Filament growth dynamics in solid electrolyte-based resistive memories revealed by in situ TEM
https://doi.org/10.1007/s12274-014-0469-0
Published: 25 June 2014
2014, 7 (7): 1065-1072
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