@article{Xin2019, 
author = {Wei Xin and Hao Bo Jiang and Teng Qian Sun and Xiao Guang Gao and Shao Nan Chen and Bo Zhao and Jian Jun Yang and Zhi Bo Liu and Jian Guo Tian and Chun Lei Guo},
title = {Optical anisotropy of black phosphorus by total internal reflection},
year = {2019},
journal = {Nano Materials Science},
volume = {1},
number = {4},
pages = {304-309},
keywords = {Black phosphorus, Optical anisotropy, Total internal reflection, Biaxial crystal},
url = {https://www.sciopen.com/article/10.1016/j.nanoms.2019.09.006},
doi = {10.1016/j.nanoms.2019.09.006},
abstract = {Although abundant research on the anisotropy of van der Waals (vdW) materials has been published, we undertake an in-depth study of their optical properties as they have an important guiding role for light control in two-dimensional (2D) nanospace. As an example, we study the reflectance of few-layered black phosphorus (BP) in the total internal reflection (TIR) mode in detail. We demonstrate that its optical anisotropy can be changed on a large scale by varying the incident angles, polarization states, and the in-plane rotation angles of the BP samples. Theoretical analysis indicates that the phenomena observed are common to all the atom-thick biaxial cry stals, so these conclusions can be widely applied to other anisotropic 2D materials. This research furthers the current understanding of the properties of BP more comprehensively, and provides guidance for developing new optoelectronic applications, especially when BP and other atom-thick biaxial crystals are integrated with TIR devices.}
}