TY  - JOUR
AU  - Cheng, Xiangrui
AU  - Li, Huaizhou
AU  - Han, Jiangna
AU  - Zhao, Ying
AU  - Yang, Shuqing
AU  - Xiang, Mingjie
AU  - Zhang, Yibo
AU  - Wang, Xiaoting
AU  - Yan, Haohao
AU  - Cao, Shuaiwei
AU  - Han, Dejun
AU  - Wu, Jianhui
AU  - Kang, Zhensheng
AU  - Zeng, Qingdong
AU  - Liu, Shengjie
PY  - 2026
TI  - Fine mapping of the stripe rust resistance gene Yr85 in wheat
JO  - The Crop Journal
SN  - 2095-5421
SP  - 1267
EP  - 1276
VL  - 14
IS  - 4
AB  - Breeding resistant wheat (Triticum aestivum) cultivars is the most efficient way to manage wheat stripe rust, a highly destructive disease caused by the fungal pathogen Puccinia striiformis f. sp. tritici (Pst). Therefore, the exploration of new resistance genes is ongoing. The resistance gene Yr85 confers protection against predominant Pst races in China at all stages of plant development. Here, we fine-mapped Yr85 to a 0.12 cM interval between allele-specific quantitative PCR markers XK1B-61 and XK1B-65, corresponding to a 1.76 Mb region on chromosome 1BS in the IWGSC RefSeq v2.1 reference genome (wheat cultivar Chinese Spring), using 5507 F5 plants derived from heterozygous F4 plants, themselves descendants of an AvS × AvSYr85NIL cross. Haplotype analysis and whole-genome resequencing suggested that Yr85 may be from a distant source. Moreover, agronomic trait evaluation indicated that Yr85 is located in a chromosomal region lacking linkage drag. Genotyping of 309 Chinese wheat cultivars and lines with a marker that cosegregated with Yr85 during fine mapping identified one cultivar possibly carrying the resistance gene. Our findings indicate that Yr85 has potential for use in wheat-breeding programs in China. This study lays the foundation for map-based cloning and marker-assisted selection of Yr85.
UR  - https://doi.org/10.1016/j.cj.2026.03.015
DO  - 10.1016/j.cj.2026.03.015