@article{LI2007, 
author = {Guanghui LI and Dongqin FENG},
title = {Test Generation with Unspecified Variable Assignments},
year = {2007},
journal = {Tsinghua Science and Technology},
volume = {12},
number = {S1},
pages = {180-185},
keywords = {test generation, formal verification, boolean satisfiability, unspecified assignments},
url = {https://www.sciopen.com/article/10.1016/S1007-0214(07)70106-2},
doi = {10.1016/S1007-0214(07)70106-2},
abstract = {ATPG for very large scale integrated circuit designs is an important problem in industry. With the advent of SOC designs, testing and verification of the core-based designs become a challenging problem. This paper presents an algebraic test generation algorithm with unspecified variable assignments. Given a stuck at fault of the circuit with unspecified signals, the proposed algorithm uses a new encoding scheme for unspecified variable assignments, and solves the Boolean satisfiability formula representing the Boolean difference to obtain a test pattern. Experimental results demonstrate the efficiency and feasibility of the proposed algorithm.}
}