@article{TAO2025, 
author = {Tianjiong TAO and Jidong WENG and Xiang WANG and Shenggang LIU and Heli MA and Chengjun LI and Xing JIA and Long CHEN and Jian WU and Longhuang TANG and Yongchao CHEN},
title = {Shock Parameter Measurement of Sub-Micrometer Aluminum Driven by Laser Using Frequency Domain Interferometer},
year = {2025},
journal = {Chinese Journal of High Pressure Physics},
volume = {39},
number = {4},
keywords = {shock wave, femtosecond laser, frequency domain interfering, equation of state},
url = {https://www.sciopen.com/article/10.11858/gywlxb.20240967},
doi = {10.11858/gywlxb.20240967},
abstract = {For aluminum films with submicron thickness deposited on quartz substrates, femtosecond laser pulses (35 fs pulse width, 0.5 mJ energy, and a central wavelength of 800 nm) were focused on the surface to induce rapid thermal expansion through laser ablation. This process generated shock wave propagation and achieved high-pressure loading on the aluminum samples. Through the quartz window on the backside of the aluminum sample, frequency-domain interferometry was employed to simultaneously measure shock-induced radial displacement profiles, particle velocities, and shock wave propagation velocities. Experimental repeatability for multiple shots was enhanced through pulse energy and shock position monitoring. A phase comparison algorithm was applied for data analysis, achieving sub-nanometer displacement resolution and sub-picosecond temporal resolution. This methodology successfully captured the interfacial shock profile evolution history in the aluminum film under approximately 130 GPa of pressure.}
}