@article{XU2025, 
author = {Zihui XU and Ying SUN and Xiuliang YUAN and Shihai AN},
title = {EXPERIMENTAL METHOD FOR MEASURING SINGLE CRYSTAL SAMPLES BY UNIVERSAL X-RAY DIFFRACTOMETER},
year = {2025},
journal = {Physics and Engineering},
volume = {35},
number = {6},
pages = {133-137},
keywords = {X-ray diffraction, single-crystal, rocking curve},
url = {https://www.sciopen.com/article/10.26599/PHYS.2025.9320622},
doi = {10.26599/PHYS.2025.9320622},
abstract = {X-ray diffraction (XRD) analysis is a fundamental means of characterizing the structure of materials and is indispensable in the research of disciplines such as materials science, physics, and chemistry. Compared with polycrystals, single crystals have more important research and application value in frontier fields such as semiconductors, nonlinear optics, superconductivity, and topological insulators. However, at present, most universities and research institutions are equipped with general-purpose X-ray diffractometers, and the testing steps for single crystal samples are relatively complex. This paper uses a Bruker D8 Advance diffractometer to conduct X-ray diffraction experiments on Si(001) single crystals and elaborates on the experimental steps and results, providing a reference for teaching and research work involving X-ray diffraction experiments.}
}