@article{SUN2023, 
author = {Pengyue SUN and Shenglai LYU and Erkun MAO and Shuzheng ZHANG and Lei CHEN and Huan ZHOU and Yangbo HUANG and Shengqiang LOU},
title = {Accelerated fault injection algorithm for SRAM-based FPGA using whole frame upset},
year = {2023},
journal = {Journal of National University of Defense Technology},
volume = {45},
number = {5},
pages = {207-211},
keywords = {fault injection, whole frame upset, UR-SB, reliability of anti-irradiation, FPGA},
url = {https://www.sciopen.com/article/10.11887/j.cn.202305024},
doi = {10.11887/j.cn.202305024},
abstract = {UR-SB (unrecoverable-sensitive bits), which cannot be corrected by regular refresh, will cause long-term interruption of on-orbit service of satellite load. Thus, the impact of UR-SB needs to be evaluated and improved deeply by the fault injection tests. However, the proportion of UR-SB is extremely low. If the traditional bit-by-bit upset fault injection method is adopted, the fault injection tests would take too long time, and the efficiency is extremely low. A fault injection acceleration algorithm for static random access memory-based field programmable gate array based on whole frame upset was proposed, which can quickly filter out the configuration frames without UR-SB through whole frame upset fault injection. By taking dichotomy on the configuration frames with UR-SB, the precise positioning process of UR-SB can be speeded up effectively. Taking the commonly used XQR2V3000 device as an example, the simulation results indicate that the test efficiency can be improved by 207 times under the poor conditions, and the real data experimental results of the signal generation load by our group are increased by 949 times. These results demonstrate the validity of the acceleration algorithm proposed in this article.}
}